51. Auger Parameter of Hafnium in Elemental Hafnium and in Hafnium oxide
A. R. Chourasia and R. L. Miller
Surface Science 573, 320-326 (2004)
50. Appearance Potential Spectroscopy
A. R. Chourasia
Surface Analysis, Encyclopedia of Analytical Science, Second Edition, Academic Press, England, 2004
(Review Article)
49. A study of Amorphous Ti-Ni Alloys by X-ray Photoelectron Spectroscopy
M. A. Seabolt, W. R. Ogden, A. R. Chourasia, and A. Ishida
Journal of Electron Spectroscopy and Related Phenomena, 135, 135-141 (2004).
48. Effects of Growth and Postgrowth Parameters on the Microstructure and Copper distribution in Al(Cu)/SiO2 Thin Films
N. Hozhabri, K. M. Watson, S. C. Sharma, and A. R. Chourasia
Journal of Electronics materials, 81, L7-L10 (2002).
47. Composition dependence of the spin wave stiffness parameter in La1-xCaxMnO3 CMR materials
J. J. Rhyne, H. Kaiser, L. Stumpe, J. F. Mitchell, T. McCloskey, and A. R. Chourasia
Journal of Magnetism and Magnetic Materials, 226-230, 775-776 (2001).
46. Core level XPS spectra of silicon carbide using Zirconium and Magnesium radiation
A. R. Chourasia
Surface Science Spectra 8, 45-55 (2001).
45. Auger electron appearance potential spectroscopy study of CrNx Films
A. R. Chourasia and S. J. Hood
Surface and Interface Analysis, 31, 291-296 (2001).
44. Core level XPS spectra of Cr and N in chromium nitride films
A. R. Chourasia
Surface Science Spectra 7, 150-166 (2000).
43. Spin dynamics and absence of a central peak anomaly in La0.67Ca0.33MnO3
J. J. Rhyne, H. Kaiser, L. Stumpe, J. F. Mitchell, T. McCloskey, and A. R. Chourasia
Journal of Applied Physics 87, 5813-5815 (2000).
42. Soft X-ray Appearance Potential Study of Rare Earth-manganese Compounds
A. R. Chourasia and S. D. Deshpande
AIP CP475, Applications of Accelerators in Research and Industry, Edited by J. L. Duggan and I. L. Morgan, 488-491 (1999)
41. A Study of CrNx Thin Films by X-ray Photoelectron Spectroscopy
Christi Emery, A. R. Chourasia, and P. Yashar
Journal of Electron Spectroscopy and Related Phenomena
104, 91-97 (1999)
40. Core level XPS Spectra of elemental silicon using zirconium radiation
A. R. Chourasia
Surface Science Spectra, 5, 115-121 (1998)
39. Appearance Potential Spectroscopy: A Surface Sensitive Technique to Characterize Materials
A. R. Chourasia
Trends in Vacuum Science and Technology, 2, 113-121 (1997)
(Review Article)
38. Auger Electron Spectroscopy
A. R. Chourasia and D. R. Chopra
Handbook of Analytical Chemistry, (Prentice Hall, 1997), Chapter 42, pp. 791-808
(Chapter Contribution)
37. X-ray Photoelectron Spectroscopy
D. R. Chopra and A. R. Chourasia
Handbook of Analytical Chemistry, (Prentice Hall, 1997), Chapter 43, pp. 809-827
(Chapter Contribution)
36. A Study of Si-Compounds by Zr Là Photoelectron Spectroscopy
A. R. Chourasia, S. J. Hood, and D. R. Chopra
Journal of Vacuum Science and Technology A 14, 699-703 (1996)
35. Appearance Potential Spectroscopy
D. R. Chopra and A. R. Chourasia Surface Analysis, Encyclopedia of Analytical Science, Academic Press, England, pp. 4893-4899 (1996)
(Review Article)
34. X-ray Photoelectron study of TiN/SiO2 and TiN/Si Interfaces
A. R. Chourasia and D. R. Chopra
Thin Solid Films, 266, 298-301 (1995)
33. Surface Characterization
G. E. McGuire, M. L. Swanson, N. R. Parikh, S. Simko, P. S. Weiss, J. H. Ferris, R. J. Nemanich, D. R. Chopra and A. R. Chourasia
Analytical Chemistry, 67, 199R-220R (1995)
(Review Article)
32. Elemental Manganese studied by X-ray Photoelectron Spectroscopy using Mg and Zr Radiations
A. R. Chourasia and D. R. Chopra
Surface Science Spectra, 3, 74-81 (1995)
31. Appearance Potential Study of PrMn2 and SmMn2 Intermetallics
A. R. Chourasia, M. A. Seabolt, R. L. Justiss, D. R. Chopra, and G. Wiesinger
Journal of Alloys and Compounds, 224, 287-291 (1995)
30. A Study of the Electronic Structure of GdMn2 by Appearance Potential Spectroscopy
A. R. Chourasia, D. R. Chopra and G. Wiesinger
Journal of Electron Spectroscopy and Related Phenomena, 70, 23-28(1994)
29. A Study of Si3N4 by XPS
A. R. Chourasia and D. R. Chopra
Surface Science Spectra, 2, 117-122 (1994)
28. Surface Characterization
G. E. McGuire, M. A. Ray, S. J. Simko, F. K. Perkins, S. L. Brandow, A. Dobisz, R. J. Nemanich, A. R. Chourasia and D. R. Chopra
Analytical Chemistry, 65, 311R-333R (1993)
(Review Article)
27. Scanning Tunneling Microscopy of the Electronic Structure of Chemical Vapor Deposited Diamond Films
J. M. Perez, C. Lin, W. Rivera, R. C. Hyer, M. Green, S. C. Sharma, D. R. Chopra and A. R. Chourasia
Applied Physics Letters, 62, 1889-1891 (1993)
26. X-ray photoelectron study of TiN
A. R. Chourasia and D. R. Chopra
Surface Science Spectra, 1, 233- 237 (1992)
25. Angle-resolved X-ray Photoemission study of CaF2/Si(111) Interfaces
A. R. Chourasia, D. R. Chopra, C-C. Cho and B. E. Gnade
Surface Science, 275, 424-432 (1992)
24. Sputter Deposited Aluminum Nitride
A. R. Chourasia, D. R. Chopra, and T. K. Hatwar
Surface Science Spectra, 1, 75-79 (1992)
23. A Study of YBaCuO/W/Si by X-ray Photoelectron Spectroscopy
D. R. Chopra, A. R. Chourasia, Li Chen, A. H. Bensaoula, and A. Bensaoula
Journal of Vacuum Science and Technology, A 10, 1547-1553 (1992)
22. A Study of Y-Ba-Cu-O/Si Interfaces by X-ray Photoelectron Spectroscopy
A. R. Chourasia, D. R. Chopra, A. H. Bensaoula, A. Bensaoula, and P. Ruzakowski
Journal of Vacuum Science and Technology, A 10, 115-121 (1992)
21. Diamond and Amorphous Carbon Films
D. R. Chopra, A. R. Chourasia, M. Green, R. C. Hyer, K. K. Mishra, & S. C. Sharma
Surface Modification Technologies IV, 583-591 (1991)
20. Growth of Diamond and Diamond-like Carbon Films and Characterization by Raman, Scanning Electron Microscopy, and X-ray Photoelectron Spectroscopy
S. C. Sharma, M. Green, R. C. Hyer, C. A. Dark, T. D. Black, A. R. Chourasia, D. R. Chopra, and K. K. Mishra
Journal of Materials Research, 5, 2424-2432 (1990)
19. Characterization of Low Pressure Deposited Diamond Films by X-ray Photoelectron Spectroscopy
A. R. Chourasia, D. R. Chopra, S. C. Sharma, M. Green, C.A. Dark, R. C. Hyer
Thin Solid Films, 193/194, 1079-1086 (1990)
18. Deposition of Diamond Films at Low Pressures and their Characterization by Positron annihilation, Raman, SEM, and XPS
S. C. Sharma, C. A. Dark, R. C. Hyer, M. Green, T. D. Black, A. R. Chourasia, D. R. Chopra, and K. K. Mishra
Applied Physics Letters, 56, 1781-1783 (1990)
17. X-ray photoelectron study of Al-Mn Alloys
A. R. Chourasia and D. R. Chopra
Journal of Electron Spectroscopy and Related Phenomena, 52, 541-550 (1990)
16. Soft X-ray Appearance Potential Spectroscopy study of Ni-Fe alloys
A. R. Chourasia and D. R. Chopra
Nuclear Instruments and Methods, B40/41, 376-378 (1989)
15. Surface Characterization
J. E. Fulghum, G. E. McGuire, I. H. Musselman, R. J. Nemanich, J. M. White, D. R. Chopra, and A. R. Chourasia
Analytical Chemistry, 61, 243R-269R (1989)
(Review Article)
14. SXAPS study of Pr2Fe14-xCoxB
A. R. Chourasia and D. R. Chopra
Journal of Vacuum Science and Technology, A 7, 2075-2079 (1989)
13. Characterization of semiconductor surfaces by Appearance Potential Spectroscopy
D. R. Chopra and A. R. Chourasia
"Characterization of semiconductor materials" Vol 1
Editor Dr. G. McGuire (Noyes Publication, 1989) pp 289-327
(Chapter Contribution)
12. SXAPS study of Nd2Fe14B
A. R. Chourasia and D. R. Chopra
Journal of Less Common Metals, 148, 413-420 (1989)
11. Appearance Potential Spectroscopy of Solid Surfaces
D. R. Chopra and A. R. Chourasia
Scanning Micros., 2, 677-702 (1988)
(Review Article)
10. Soft X-ray Appearance Potential study of Ni74Fe26
A. R. Chourasia and D. R. Chopra
Surface Science, 206, 484-494 (1988)
9. A study of LaH3 by Auger Electron Appearance Potential Spectroscopy
A. R. Chourasia and D. R. Chopra
Journal of Electron Spectroscopy and Related Phenomena, 43, 233-241(1987)
8. XPS study of the Ni/Si oxide/Si Interface
T. R. Dillingham, A. R. Chourasia, D. R. Chopra, S. R. Martin, K. L. Peterson, C. Z. Hu and B. Gnade
Journal of Vacuum Science and Technology, A 5, 3340-3345 (1987)
7. Study of the Ti/Si Interface using X-ray Photoelectron and Auger Electron Appearance Potential Spectroscopies
D. R. Chopra, A. R. Chourasia, T. R. Dillingham, K. L. Peterson & B. Gnade
Journal of Vacuum Science and Technology, A 5, 1984-1987 (1987)
6. Study of 4f levels in lanthanides by Appearance Potential Spectroscopy
D. R. Chopra, A. R. Chourasia & P. V. Prasad
Journal of Electron Spectroscopy and Related Phenomena, 41, 167-173 (1986)
5. X-ray spectroscopic study of arsenic chalcogenides of the type As2X3 ( where X = O,S,Se and Te )
C. Mande & A. R. Chourasia
Indian Journal of Physics, 60B, 72-83 (1986)
4. EXAFS study of intermetallics of the type RGe2 ( R = La, Ce, Pr, Nd, Sm, Gd, Tb, Dy, Ho, Er and Y ) Part II: Determination of Ge-R distances
A. R. Chourasia, V. D. Chafekar & C. Mande
Pramana, 24, 867-873 (1985)
3. EXAFS study of intermetallics of the type RGe2 ( R = La, Ce, Pr, Nd, Sm, Gd, Tb, Dy, Ho, Er and Y ) Part I: Determination of Ge-Ge distances
A. R. Chourasia, V. D. Chafekar, S. D. Deshpande & C. Mande
Pramana, 24, 787-796 (1985)
2. EXAFS study of intermetallics of the type RGe2 ( R = La, Ce, Pr, Nd, Sm, Gd, Tb, Dy, Ho, Er and Y )
A. R. Chourasia, V. D. Chafekar, S. D. Deshpande, V. B. Sapre & C. Mande
Springer Proceedings in Physics, 2, 455- 457 (1984)
1. Chemical shifts in K absorption discontinuities of germanium and selenium in some amorphous compounds
Y. L. Rao, A. R. Chourasia & C. Mande
Journal of Non-crystalline Solids, 43, 13-19 (1981)
Appearance Potential Spectroscopy study of Ti-Ni Alloys
Invited Talk
17th International Conference on the Application of Accelerators in Research & Industry, Denton, Nov. 12-16, 2002
AEAPS study of Ti-Ni alloys
Sigma Xi Research Symposium, April 11, 2002, A&M Commerce.
Electronic structure study of Ti-Ni amorphous and crystalline alloys by Auger electron appearance potential spectroscopy
American Physical Society March Meeting, Indianapolis, IN, March 18-22, 2002
Background effects in the core level XPS spectra of Ti-Ni alloys
American Physical Society March Meeting, Indianapolis, IN, March 18-22, 2002
A study of unoccupied density of states in La1-xCaxMnO3 compounds by Auger electron appearance potential spectroscopy
American Physical Society March Meeting, Indianapolis, IN, March 18-22, 2002
Oxidation of Copper studied by X-ray Photoelectron Spectroscopy
Joint Fall Meeting of the Texas Section of the American Physical Society, Texas Christian University, Fort Worth, Texas, October 6, 2001
Estimation of density of states in Crystalline Titanium-Nickel Compounds using X-ray Photoelectron Spectroscopy
Joint Fall Meeting of the Texas Section of the American Physical Society, Texas Christian University, Fort Worth, Texas, October 6, 2001
Ti 2p AEAPS spectra in amorphous and crystalline Ti-50%Ni compounds
Eighth Sigma Xi Annual Research Forum, A & M - Commerce, April 19, 2001
Importance of background in XPS spectra in estimating the density of states at the Fermi level
Eighth Sigma Xi Annual Research Forum, A & M - Commerce, April 19, 2001
Determination of thickness of deposited films using x-ray photoelectron spectra
Eighth Sigma Xi Annual Research Forum, A & M - Commerce, April 19, 2001
Appearance Potential Spectroscopy Study of CrNx Thin Films
Quantitative Surface Analysis - 11, July 3 - 7, 2000, University of Surrey, Guildford, UK
Determining Density of Conduction Band States from Appearance Potential Spectroscopy
Texas Sections of the AAPT, APS, and SPS, October 28-29, 1999 Austin, Texas
Soft x-ray appearance potential study of Rare Earth Manganese Compounds
Fifteenth International Conference on the Application of Accelerators in Research and Industry, Nov. 4-7, 1998, Denton, Texas
Design of a High Resolution XANES Monochromator
Fifteenth International Conference on the Application of Accelerators in Research and Industry, Nov. 4-7, 1998, Denton, Texas
Photoenhanced RIE of III-V Nitrides in BCl3/Cl2/Ar/N2 Plasmas
45th American Vacuum Society International Symposium, Nov. 2-6, 1998, Baltimore, MD
Reactive ion etching of BN and GaN using Cl2/Ar and BCl3/Cl2/Ar plasmas
The Texas Surface Science Round Up, May 27, 1998 Houston, Texas
Electronic Structure study of amorphous and crystalline Ti-Ni films by X-ray Photoelectron Spectroscopy
5th annual TAMU-C Sigma Xi Student Research Forum, April 9, 1998
The study of CrNx films by X-ray Photoelectron Spectroscopy
5th annual TAMU-C Sigma Xi Student Research Forum, April 9, 1998
Electronic Structure Study of Amorphous and Crystalline Ti-Ni Films by X-ray Photoelectron Spectroscopy
Texas Sections of the AAPT, APS, and SPS, March 19-21, San Antonio, Texas
Study of CrNx Films by X-ray Photoelectron Spectroscopy
Texas Sections of the AAPT, APS, and SPS, March 19-21, San Antonio, Texas
EXAFS studies of amorphous Ni-Ti thin films
American Physical Society, University of Texas at Arlington, Texas, October 10-12, 1996
Electronic structure of RMn2 compounds by Appearance Potential Spectroscopy
42nd National Symposium of American Vacuum Society, Minneapolis, MN, Oct. 16 - 20, 1995
A study of Si-compounds by Zr L photoelectron spectroscopy
42nd National Symposium of American Vacuum Society, Minneapolis, MN, Oct. 16 - 20, 1995
Interdiffusion study of cobalt-silicon interfaces by X-ray Photoelectron Spectroscopy
American Physical Society, Sam Houston State University, Huntsville, Texas, March 2-4, 1995
X-ray photoelectron study of Co/Si interfaces
124th TMS Annual Meeting, Las Vegas, February 12-16, 1995
Characterization of TiN/Si, TiN/SiO2, and W/TiN Interfaces
Twelfth Joint Symposium by North Texas Materials Characterization Society, Texas Chapter of the American Vacuum Society, and the North Texas Section of the Electrochemical Society, Austin, June 7-8,1993
Angle Resolved X-ray Photoelectron Spectroscopy Study of CaF2/Si(111) Interfaces
American Physical Society, South Western Texas State University, San Marcos, Texas, March 6-7, 1992
Diamond and Amorphous Carbon Films
Fourth International Conference on Surface Modification Technologies, Paris, France, Nov. 6-8, 1990
A study of Y-Ba-Cu-O on Si, SiO2, MgO, and W/Si by X-ray Photoelectron Spectroscopy
37th Symposium of American Vacuum Society, Toronto, Canada, Oct.8-12, 1990
Characterization of Low Pressure deposited Diamond Films
8th International Conference on Thin Films, San Diego, CA, April 2-6, 1990
SXAPS study of Al-Mn alloys
36th National Symposium of AVS, Boston, MA, Oct. 23-27, 1989
X-ray photoelectron study of Al-Mn alloys
Fourth International Conference on Electron Spectroscopy, University of Hawaii at Manoa, Honolulu, Hawaii, July 10-14, 1989
A study of W-Ti-Si and W-Ti-SiO2 interfaces by Auger Electron Spectroscopy,Rutherford Backscattering Spectrometry and X-ray Photoelectron Spectroscopy
Eighth Joint Symposium by North Texas Materials Characterization Society, Texas Chapter of the American Vacuum Society, and the North Texas Section of the Electrochemical Society, Dallas, June 5,1989
Appearance Potential Study of Ni74Fe26
March 4, 1988 at the 91st Annual Meeting of Texas Academy of Science, Commerce, Texas
XPS study of Transition Metal-Silicon Interfaces
American Physical Society, March 6, 1987 at Abilene Christian University, Abilene, Texas
Electronic Properties of Transition Metal-Silicon Interfaces
American Chemical Society, Houston, Nov. 19, 1986
Study of the 4f levels in Lanthanides by Appearance Potential Spectroscopy
American Physical Society, April 4, 1986 at The Univ. of Texas at Dallas, Texas
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